Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device

Francesco De Martini; Andrea Mazzei; Marco Ricci; Giacomo Mauro D'Ariano

doi:10.1103/PhysRevA.67.062307

Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device

Quantum Physics 2009-11-07 v1

Authors: Francesco De Martini , Andrea Mazzei , Marco Ricci , Giacomo Mauro D'Ariano

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Abstract

We present the first full experimental quantum tomographic characterization of a single-qubit device achieved with a single entangled input state. The entangled input state plays the role of all possible input states in quantum parallel on the tested device. The method can be trivially extended to any n-qubits device by just replicating the whole experimental setup n times.

Keywords

quantum tomography single-qubit device entangled input state quantum parallelism quantum characterization n-qubit extension

Cite

@article{arxiv.quant-ph/0210210,
  title  = {Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device},
  author = {Francesco De Martini and Andrea Mazzei and Marco Ricci and Giacomo Mauro D'Ariano},
  journal= {arXiv preprint arXiv:quant-ph/0210210},
  year   = {2009}
}

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4 pages in revtex4 with 4 eps figures

Exploiting quantum parallelism of entanglement for a complete experimental quantum characterization of a single qubit device

Abstract

Keywords

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