Experimental Measurement of Multi-dimensional Entanglement via Equivalent Symmetric Projection
Abstract
We construct a linear optics measurement process to determine the entanglement measure, named \emph{I-concurrence}, of a set of dimensional two-photon entangled pure states produced in the optical parametric down conversion process. In our experiment, an \emph{equivalent} symmetric projection for the two-fold copy of single subsystem (presented by L. Aolita and F. Mintert, Phys. Rev. Lett. \textbf{97}, 050501 (2006)) can be realized by observing the one-side two-photon coincidence without any triggering detection on the other subsystem. Here, for the first time, we realize the measurement for entanglement contained in bi-photon pure states by taking advantage of the indistinguishability and the bunching effect of photons. Our method can determine the \emph{I-concurrence} of generic high dimensional bipartite pure states produced in parametric down conversion process.
Keywords
Cite
@article{arxiv.0706.0935,
title = {Experimental Measurement of Multi-dimensional Entanglement via Equivalent Symmetric Projection},
author = {F. W. Sun and J. M. Cai and J. S. Xu and G. Chen and B. H. Liu and C. F. Li and Z. W. Zhou and G. C. Guo},
journal= {arXiv preprint arXiv:0706.0935},
year = {2007}
}
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4 figures