Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity
Abstract
We describe exciton-polariton modes formed by the interaction between excitons in a 2D layer of a transition metal dichalcogenide embedded in a cylindrical microcavity and the microcavity photons. For this, an expression for the excitonic susceptibility of a semiconductor disk placed in the symmetry plane perpendicular to the axis of the microcavity is derived. Semiclassical theory provides dispersion relations for the polariton modes, while the quantum-mechanical treatment of a simplified model yields the Hopfield coefficients, measuring the degree of exciton-photon mixing in the coupled modes. The density of states (DOS) and its projection onto the photonic and the excitonic subspaces are calculated taking monolayer MoS 2 embedded in a Si 3 N 4 cylinder as an example. The calculated results demonstrate a strong enhancement, for certain frequencies, of the total and local DOS (Purcell effect) caused by the presence of the 2D layer.
Keywords
Cite
@article{arxiv.1911.07312,
title = {Exciton-polaritons of a 2D semiconductor layer in a cylindrical microcavity},
author = {José Nuno S. Gomes and Carlos Trallero-Giner and Nuno M. R. Peres and Mikhail I. Vasilevskiy},
journal= {arXiv preprint arXiv:1911.07312},
year = {2020}
}