English

Evidence of defect-induced ferromagnetism in ZnFe$_{2}$O$_{4}$ thin films

Materials Science 2015-05-28 v1

Abstract

X-ray absorption near-edge and grazing incidence X-ray fluorescence spectroscopy are employed to investigate the electronic structure of ZnFe2_{2}O4_{4} thin films. The spectroscopy techniques are used to determine the non-equilibrium cation site occupancy as a function of depth and oxygen pressure during deposition and its effects on the magnetic properties. It is found that low deposition pressures below 103^{-3} mbar cause iron superoccupation of tetrahedral sites without Zn2+^{2+} inversion, resulting in an ordered magnetic phase with high room temperature magnetic moment.

Keywords

Cite

@article{arxiv.1106.3128,
  title  = {Evidence of defect-induced ferromagnetism in ZnFe$_{2}$O$_{4}$ thin films},
  author = {C. E. Rodríguez Torres and F. Golmar and M. Ziese and P. Esquinazi and S. P. Heluani},
  journal= {arXiv preprint arXiv:1106.3128},
  year   = {2015}
}

Comments

Accepted for publication in Phys. Rev. B