Evidence for Strain-Induced Local Conductance Modulations in Single-Layer Graphene on SiO2
Abstract
Graphene has emerged as an electronic material that is promising for device applications and for studying two-dimensional electron gases with relativistic dispersion near two Dirac points. Nonetheless, deviations from Dirac-like spectroscopy have been widely reported with varying interpretations. Here we show evidence for strain-induced spatial modulations in the local conductance of single-layer graphene on SiO2 substrates from scanning tunneling microscopic (STM) studies. We find that strained graphene exhibits parabolic, U-shaped conductance vs. bias voltage spectra rather than the V-shaped spectra expected for Dirac fermions, whereas V-shaped spectra are recovered in regions of relaxed graphene. Strain maps derived from the STM studies further reveal direct correlation with the local tunneling conductance. These results are attributed to a strain-induced frequency increase in the out-of-plane phonon mode that mediates the low-energy inelastic charge tunneling into graphene.
Keywords
Cite
@article{arxiv.0903.2327,
title = {Evidence for Strain-Induced Local Conductance Modulations in Single-Layer Graphene on SiO2},
author = {M. L. Teague and A. P. Lai and J. Velasco and C. R. Hughes and A. D. Beyer and M. W. Bockrath and C. N. Lau and N. -C. Yeh},
journal= {arXiv preprint arXiv:0903.2327},
year = {2009}
}
Comments
5 pages, 4 figures. Corresponding author: Nai-Chang Yeh ([email protected])