English

Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras

Computer Vision and Pattern Recognition 2020-03-24 v2

Abstract

This paper presents a novel method for labeling real-world neuromorphic camera sensor data by calculating the likelihood of generating an event at each pixel within a short time window, which we refer to as "event probability mask" or EPM. Its applications include (i) objective benchmarking of event denoising performance, (ii) training convolutional neural networks for noise removal called "event denoising convolutional neural network" (EDnCNN), and (iii) estimating internal neuromorphic camera parameters. We provide the first dataset (DVSNOISE20) of real-world labeled neuromorphic camera events for noise removal.

Keywords

Cite

@article{arxiv.2003.08282,
  title  = {Event Probability Mask (EPM) and Event Denoising Convolutional Neural Network (EDnCNN) for Neuromorphic Cameras},
  author = {R. Wes Baldwin and Mohammed Almatrafi and Vijayan Asari and Keigo Hirakawa},
  journal= {arXiv preprint arXiv:2003.08282},
  year   = {2020}
}

Comments

submitted to CVPR 2020