Precise control is an essential and elusive quality of emerging self-driving microscopes. It is widely understood these instruments must be capable of performing rapid, high-volume, and arbitrary movements for practical self-driving operation. However, stage movements are difficult to automate at scale, owing to mechanical instability, hysteresis, and thermal drift. Such difficulties pose major barriers to intelligent microscope designs that require repeatable, precise movements. To guide design of emerging instruments, it is necessary to understand the behavior of existing designs to identify rate limiting steps for full autonomy. Here we describe a general framework to evaluate stage motion in any electron microscope. We define metrics to evaluate stage degrees of freedom, propose solutions to improve performance, and comment on fundamental limits to automated experimentation using present hardware.
Cite
@article{arxiv.2212.08683,
title = {Evaluating Stage Motion for Automated Electron Microscopy},
author = {Kevin R. Fiedler and Matthew Olszta and Kayla Yano and Christina Doty and Derek Hopkins and Sarah Akers and Steven R. Spurgeon},
journal= {arXiv preprint arXiv:2212.08683},
year = {2023}
}