We study power corrections in the Drell-Yan (DY) process using state-of-the-art predictions for both neutral and charged current production. For both types of DY processes, we account for power corrections arising from bottom and charm quark effects within a variable flavor number scheme. Our results show that these corrections become significant in the low-Q region. We also ensure proper treatment of overlapping contributions by carefully applying matching procedures to eliminate any double counting.
@article{arxiv.2602.04639,
title = {Estimating power corrections for the Drell-Yan Process},
author = {Ekta Chaubey and Pooja Mukherjee},
journal= {arXiv preprint arXiv:2602.04639},
year = {2026}
}
Comments
Review article, contribution for the "Advanced School and Workshop on Multiloop Scattering Amplitudes" held in NISER, Bhubaneswar, India in January 2024