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Empirical Perspectives on One-Shot Semi-supervised Learning

Machine Learning 2020-04-09 v1 Computer Vision and Pattern Recognition Machine Learning

Abstract

One of the greatest obstacles in the adoption of deep neural networks for new applications is that training the network typically requires a large number of manually labeled training samples. We empirically investigate the scenario where one has access to large amounts of unlabeled data but require labeling only a single prototypical sample per class in order to train a deep network (i.e., one-shot semi-supervised learning). Specifically, we investigate the recent results reported in FixMatch for one-shot semi-supervised learning to understand the factors that affect and impede high accuracies and reliability for one-shot semi-supervised learning of Cifar-10. For example, we discover that one barrier to one-shot semi-supervised learning for high-performance image classification is the unevenness of class accuracy during the training. These results point to solutions that might enable more widespread adoption of one-shot semi-supervised training methods for new applications.

Keywords

Cite

@article{arxiv.2004.04141,
  title  = {Empirical Perspectives on One-Shot Semi-supervised Learning},
  author = {Leslie N. Smith and Adam Conovaloff},
  journal= {arXiv preprint arXiv:2004.04141},
  year   = {2020}
}

Comments

Short paper with interesting results pointing to further investigation

R2 v1 2026-06-23T14:44:36.329Z