Electrostatic control of phase slips in Ti Josephson nanotransistors
Abstract
The investigation of the switching current probability distribution of a Josephson junction is a conventional tool to gain information on the phase slips dynamics as a function of the temperature. Here we adopt this well-established technique to probe the impact of an external static electric field on the occurrence of phase slips in gated all-metallic titanium (Ti) Josephson weak links. We show, in a temperature range between 20 mK and 420 mK, that the evolution of the phase slips dynamics as a function of the electrostatic field starkly differs from that observed as a function of the temperature. This fact demonstrates, on the one hand, that the electric field suppression of the critical current is not simply related to a conventional thermal-like quasiparticle overheating in the weak-link region. On the other hand, our results may open the way to operate an electrostatic-driven manipulation of phase slips in metallic Josephson nanojunctions, which can be pivotal for the control of decoherence in superconducting nanostructures.
Keywords
Cite
@article{arxiv.1910.14000,
title = {Electrostatic control of phase slips in Ti Josephson nanotransistors},
author = {C. Puglia and G. De Simoni and F. Giazotto},
journal= {arXiv preprint arXiv:1910.14000},
year = {2020}
}
Comments
9 pages, 7 color figures, 1 table