Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC
Abstract
The high-luminosity upgrade of the LHC (HL-LHC) brings unprecedented requirements for precision bunch-by-bunch luminosity measurement and beam-induced background monitoring in real time. A key component of the CMS Beam Radiation Instrumentation and Luminosity detector system is a stand-alone luminometer, the Fast Beam Condition Monitor (FBCM), which is able to operate independently at all times with a triggerless asynchronous readout. FBCM utilizes a dedicated front-end ASIC to amplify the signals from CO-cooled silicon-pad sensors with 1 ns timing resolution. Front-end (FE) electronics are subject to high-radiation conditions, thus all components are radiation hardened: sensors, ASICs, transceivers, etc. The FBCM ASIC contains 6 channels, each outputting a high-speed binary signal carrying the time-of-arrival and time-over-threshold information. This signal is sent via a gigabit optical link to the back-end electronics for analysis. A dedicated test system is designed for the FBCM FE electronics with a modular setup for all testing needs of the project from initial ASIC validation test to system-level testing with the full read-out chain. The paper reports on the design, read-out architecture, and testing program for the FBCM electronics.
Cite
@article{arxiv.2410.14867,
title = {Electronics design and testing of the CMS Fast Beam Condition Monitor for HL-LHC},
author = {K. Shibin and G. Auzinger and H. Bakhshiansohi and A. Dabrowski and A. Dierlamm and M. Dragicevic and A. Gholami and G. Gomez and M. Guthoff and M. Haranko and A. Homna and M. Jenihhin and J. Kaplon and O. Karacheban and B. Korcsmáros and A. Lokhovitskiy and R. Loos and S. Mallows and J. Michel and V. Myronenko and G. Pásztor and J. Schwandt and M. Sedghi and A. Shevelev and G. Steinbrueck and D. Stickland and G. J. Wegrzyn},
journal= {arXiv preprint arXiv:2410.14867},
year = {2024}
}
Comments
6 pages, 5 figures. Presented at 6th International Conference on Technology and Instrumentation in Particle Physics (TIPP2023), 4-8 Sep 2023, Cape Town, Western Cape, South Africa. Submitted to PoS(TIPP2023)