Electro-optic dual-comb interferometry over 40-nm bandwidth
Abstract
Dual-comb interferometry is a measurement technique that uses two laser frequency combs to retrieve complex spectra in a line-by-line basis. This technique can be implemented with electro-optic frequency combs, offering intrinsic mutual coherence, high acquisition speed and flexible repetition-rate operation. A challenge with the operation of this kind of frequency comb in dual-comb interferometry is its limited optical bandwidth. Here, we use coherent spectral broadening and demonstrate electro-optic dual-comb interferometry over the entire telecommunications C band (200 lines covering ~ 40 nm, measured within 10 microseconds at 100 signal-to-noise ratio per spectral line). These results offer new prospects for electro-optic dual-comb interferometry as a suitable technology for high-speed broadband metrology, for example in optical coherence tomography or coherent Raman microscopy.
Cite
@article{arxiv.1607.04575,
title = {Electro-optic dual-comb interferometry over 40-nm bandwidth},
author = {Vicente Duran and Peter A. Andrekson and Victor Torres-Company},
journal= {arXiv preprint arXiv:1607.04575},
year = {2016}
}