We use an Atomic Force Microscope (AFM) tip to locally probe the electronic properties of semiconducting carbon nanotube transistors. A gold-coated AFM tip serves as a voltage or current probe in three-probe measurement setup. Using the tip as a movable current probe, we investigate the scaling of the device properties with channel length. Using the tip as a voltage probe, we study the properties of the contacts. We find that Au makes an excellent contact in the p-region, with no Schottky barrier. In the n-region large contact resistances were found which dominate the transport properties.
Cite
@article{arxiv.cond-mat/0305108,
title = {Electrical Nanoprobing of Semiconducting Carbon Nanotubes using an Atomic Force Microscope},
author = {Y. Yaish and J. -Y. Park and S. Rosenblatt and V. Sazonova and M. Brink and P. L. McEuen},
journal= {arXiv preprint arXiv:cond-mat/0305108},
year = {2009}
}