Electric field compensation and sensing with a single ion in a planar trap
Atomic Physics
2011-06-15 v1 Instrumentation and Detectors
Quantum Physics
Abstract
We use a single ion as an movable electric field sensor with accuracies on the order of a few V/m. For this, we compensate undesired static electric fields in a planar RF trap and characterize the static fields over an extended region along the trap axis. We observe a strong buildup of stray charges around the loading region on the trap resulting in an electric field of up to 1.3 kV/m at the ion position. We also find that the profile of the stray field remains constant over a time span of a few months.
Keywords
Cite
@article{arxiv.1106.2730,
title = {Electric field compensation and sensing with a single ion in a planar trap},
author = {Sankaranarayanan Selvarajan and Nikos Daniilidis and Sönke Möller and Rob Clark and Frank Ziesel and Kilian Singer and Ferdinand Schmidt-Kaler and Hartmut Häffner},
journal= {arXiv preprint arXiv:1106.2730},
year = {2011}
}