We have studied the diffusion of excess quasiparticles in a current-biased superconductor strip in proximity to a metallic trap junction. In particular, we have measured accurately the superconductor temperature at a near-gap injection voltage. By analyzing our data quantitatively, we provide a full description of the spatial distribution of excess quasiparticles in the superconductor. We show that a metallic trap junction contributes significantly to the evacuation of excess quasiparticles.
@article{arxiv.1106.4949,
title = {Efficient Quasiparticle Evacuation in Superconducting Devices},
author = {Sukumar Rajauria and L. M. A. Pascal and Ph. Gandit and F. W. J. Hekking and B. Pannetier and H. Courtois},
journal= {arXiv preprint arXiv:1106.4949},
year = {2015}
}