English

Effect of screening on shot noise in diffusive mesoscopic conductors

Mesoscale and Nanoscale Physics 2009-10-30 v4

Abstract

Shot noise in diffusive mesoscopic conductors, at finite observation frequencies ω\omega (comparable to the reciprocal Thouless time τT1\tau_T^{-1}), is analyzed with an account of screening. At low frequencies, the well-known result SI(ω)=2eI/3S_I(\omega)=2eI/3 is recovered. This result is valid at arbitrary ωτT\omega \tau_T for wide conductors longer than the screening length. However, at least for two very different systems, namely, wide and short conductors, and thin conductors over a close ground plane, noise approaches a different fundamental level, SI(ω)=eIS_I(\omega) = eI, at ωτT1\omega \tau _T\gg 1.

Keywords

Cite

@article{arxiv.cond-mat/9701095,
  title  = {Effect of screening on shot noise in diffusive mesoscopic conductors},
  author = {Y. Naveh and D. V. Averin and K. K. Likharev},
  journal= {arXiv preprint arXiv:cond-mat/9701095},
  year   = {2009}
}

Comments

5 pages, 3 figures. Published version. Also available in the journal's format at http://hana.physics.sunysb.edu/~yehuda/cv/papers/shotnoise.pdf