In this paper we show E-FuzzEdge, a novel fuzzing architecture targeted towards improving the throughput of fuzzing campaigns in contexts where scalability is unavailable. E-FuzzEdge addresses the inefficiencies of hardware-in-the-loop fuzzing for microcontrollers by optimizing execution speed. We evaluated our system against state-of-the-art benchmarks, demonstrating significant performance improvements. A key advantage of E-FuzzEdgearchitecture is its compatibility with other embedded fuzzing techniques that perform on device testing instead of firmware emulation. This means that the broader embedded fuzzing community can integrate E-FuzzEdge into their workflows to enhance overall testing efficiency.
@article{arxiv.2510.01393,
title = {E-FuzzEdge: Optimizing Embedded Device Security with Scalable In-Place Fuzzing},
author = {Davide Rusconi and Osama Yousef and Mirco Picca and Flavio Toffalini and Andrea Lanzi},
journal= {arXiv preprint arXiv:2510.01393},
year = {2025}
}