Dynamical scaling of $YBa_2Cu_3O_{7-\delta}$ thin film conductivity in zero field

Hua Xu; Su Li; C. J. Lobb; Steven M. Anlage

doi:10.1103/PhysRevB.80.104518

Dynamical scaling of $YBa_2Cu_3O_{7-\delta}$ thin film conductivity in zero field

Superconductivity 2011-06-07 v1 Strongly Correlated Electrons

Authors: Hua Xu , Su Li , C. J. Lobb , Steven M. Anlage

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Abstract

We study dynamic fluctuation effects of $YBa_2Cu_3O_{7-\delta}$ thin films in zero field around $T_c$ by doing frequency-dependent microwave conductivity measurements at different powers. The length scales probed in the experiments are varied systematically allowing us to analyze data which are not affected by the finite thickness of the films, and to observe single-parameter scaling. DC current-voltage characteristics have also been measured to independently probe fluctuations in the same samples. The combination of DC and microwave measurements allows us to precisely determine critical parameters. Our results give a dynamical scaling exponent $z=1.55\pm0.15$ , which is consistent with model E-dynamics.

Keywords

dynamic fluctuation effects microwave conductivity zero field critical parameters dynamical scaling exponent model E-dynamics YBa2Cu3O7-delta

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@article{arxiv.0803.0965,
  title  = {Dynamical scaling of $YBa_2Cu_3O_{7-\delta}$ thin film conductivity in zero field},
  author = {Hua Xu and Su Li and C. J. Lobb and Steven M. Anlage},
  journal= {arXiv preprint arXiv:0803.0965},
  year   = {2011}
}

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4 pages and 4 figures

Dynamical scaling of $YBa_2Cu_3O_{7-\delta}$ thin film conductivity in zero field

Abstract

Keywords

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