Dynamical random field Ising model at zero temperature
Abstract
In this paper, we study the evolution of the zero-temperature random field Ising model as the mean of the external field increases from to . We focus on two types of evolutions: the ground state evolution and the Glauber evolution. For the ground state evolution, we investigate the occurrence of global avalanche, a moment where a large fraction of spins flip simultaneously from minus to plus. In two dimensions, no global avalanche occurs, while in three or higher dimensions, there is a phase transition: a global avalanche happens when the noise intensity is small, but not when it is large. Additionally, we study the zero-temperature Glauber evolution, where spins are updated locally to minimize the Hamiltonian. Our results show that for small noise intensity, in dimensions or , most spins flip around a critical time (but we cannot decide whether such flipping occurs simultaneously or not). We also connect this process to polluted bootstrap percolation and solve an open problem on it.
Keywords
Cite
@article{arxiv.2410.20457,
title = {Dynamical random field Ising model at zero temperature},
author = {Jian Ding and Peng Yang and Zijie Zhuang},
journal= {arXiv preprint arXiv:2410.20457},
year = {2025}
}
Comments
41 pages, 11 figures; accepted for publication in Probability Theory and Related Fields