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Dynamical random field Ising model at zero temperature

Probability 2025-12-03 v3 Mathematical Physics math.MP

Abstract

In this paper, we study the evolution of the zero-temperature random field Ising model as the mean of the external field MM increases from -\infty to \infty. We focus on two types of evolutions: the ground state evolution and the Glauber evolution. For the ground state evolution, we investigate the occurrence of global avalanche, a moment where a large fraction of spins flip simultaneously from minus to plus. In two dimensions, no global avalanche occurs, while in three or higher dimensions, there is a phase transition: a global avalanche happens when the noise intensity is small, but not when it is large. Additionally, we study the zero-temperature Glauber evolution, where spins are updated locally to minimize the Hamiltonian. Our results show that for small noise intensity, in dimensions d=2d =2 or 33, most spins flip around a critical time cd=2d1+dc_d = \frac{2 \sqrt{d}}{1 + \sqrt{d}} (but we cannot decide whether such flipping occurs simultaneously or not). We also connect this process to polluted bootstrap percolation and solve an open problem on it.

Keywords

Cite

@article{arxiv.2410.20457,
  title  = {Dynamical random field Ising model at zero temperature},
  author = {Jian Ding and Peng Yang and Zijie Zhuang},
  journal= {arXiv preprint arXiv:2410.20457},
  year   = {2025}
}

Comments

41 pages, 11 figures; accepted for publication in Probability Theory and Related Fields

R2 v1 2026-06-28T19:37:10.557Z