Moir\'e superlattices in stacked 2D crystals are powerful platforms for engineering correlated and topological quantum phases, with twisted graphene and transition metal dichalcogenides (TMDs) as prominent examples. Their angle-sensitive band structures enable rich tunability; however, conventional tear-and-stack methods fix the angle at assembly, limiting systematic exploration of angle-dependent phenomena. Here, we present a scanning-probe-based manipulation scheme that enables in situ, continuous post-fabrication twist control using nanostructured metal rotors. We demonstrate reproducible angle tuning and direct moir\'e imaging across three platforms: graphene, hBN, and encapsulated, air-sensitive MoTe2. Quantitative piezoresponse force microscopy (PFM) analysis confirms sub-degree precision with minimal induced heterostrain, preserving sample quality even in the marginally twisted regime. Crucially, the device architecture maintains open access to the active region, allowing optical, scanning-probe, and transport measurements. This work enables single-device mapping of the angular phase diagram of moir\'e materials, including the twisted TMD homobilayers.
@article{arxiv.2307.06997,
title = {Dynamic twisting and imaging of moir\'e crystals},
author = {Qixuan Zhang and Lingyuan Lyu and Sneh Pancholi and Ziying Yan and Trevor Senaha and Ruolun Zhang and Chen Wu and Leonard W. Cao and Jason Tresback and Andrew Dai and Kenji Watanabe and Takashi Taniguchi and Daniel E. Parker and Monica T. Allen},
journal= {arXiv preprint arXiv:2307.06997},
year = {2026}
}