Dual structures in PZN-xPT ferroelectric relaxors

Guangyong Xu; H. Hiraka; K. Ohwada; G. Shirane

doi:10.1063/1.1751216

Dual structures in PZN-xPT ferroelectric relaxors

Materials Science 2009-11-10 v1 Strongly Correlated Electrons

Authors: Guangyong Xu , H. Hiraka , K. Ohwada , G. Shirane

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Abstract

We performed x-ray diffraction studies on a series of (1- $x$ )Pb(Zn $_{1/3}$ Nb $_{2/3}$ )O $_3$ - $x$ PbTiO $_3$ (PZN- $x$ PT) single crystals with different incident photon energies, and therefore different penetration depths. Our results show that outer-layers of $\sim 10$ to 50 $\mu$ m thick are present in all samples. The structure of those outer-layers is different from that of the inside of the crystals, by having much greater (rhombohedral) distortions. With increasing $x$ , rhombohedral-type lattice distortions develop, both in the outer-layer and the inside.

Keywords

ferroelectric phase transitions crystal structure and quasicrystals

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@article{arxiv.cond-mat/0401437,
  title  = {Dual structures in PZN-xPT ferroelectric relaxors},
  author = {Guangyong Xu and H. Hiraka and K. Ohwada and G. Shirane},
  journal= {arXiv preprint arXiv:cond-mat/0401437},
  year   = {2009}
}

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submitted to Appl. Phys. Lett

Dual structures in PZN-xPT ferroelectric relaxors

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