Few-shot anomaly detection (FSAD) plays a crucial role in industrial manufacturing. However, existing FSAD methods encounter difficulties leveraging a limited number of normal samples, frequently failing to detect and locate inconspicuous anomalies in the spatial domain. We have further discovered that these subtle anomalies would be more noticeable in the frequency domain. In this paper, we propose a Dual-Path Frequency Discriminators (DFD) network from a frequency perspective to tackle these issues. The original spatial images are transformed into multi-frequency images, making them more conducive to the tailored discriminators in detecting anomalies. Additionally, the discriminators learn a joint representation with forms of pseudo-anomalies. Extensive experiments conducted on MVTec AD and VisA benchmarks demonstrate that our DFD surpasses current state-of-the-art methods. The code is available at \url{https://github.com/yuhbai/DFD}.
@article{arxiv.2403.04151,
title = {Dual-path Frequency Discriminators for Few-shot Anomaly Detection},
author = {Yuhu Bai and Jiangning Zhang and Zhaofeng Chen and Yuhang Dong and Yunkang Cao and Guanzhong Tian},
journal= {arXiv preprint arXiv:2403.04151},
year = {2024}
}