Distribution of voltage fluctuations in a current-biased conductor
Mesoscale and Nanoscale Physics
2007-05-23 v1
Abstract
We calculate the fluctuating voltage V(t) over a conductor driven out of equilibrium by a current source. This is the dual of the shot noise problem of current fluctuations I(t) in a voltage-biased circuit. In the single-channel case the distribution of the accumulated phase Phi=(e/hbar)\int Vdt is the Pascal (or binomial waiting-time) distribution -- distinct from the binomial distribution of transferred charge Q=\int Idt. The weak-coupling limit of a Poissonian P(Phi) is reached in the limit of a ballistic conductor, while in the tunneling limit P(Phi) has the chi-square form.
Keywords
Cite
@article{arxiv.cond-mat/0210617,
title = {Distribution of voltage fluctuations in a current-biased conductor},
author = {M. Kindermann and Yu. V. Nazarov and C. W. J. Beenakker},
journal= {arXiv preprint arXiv:cond-mat/0210617},
year = {2007}
}
Comments
4 pages including 2 figures