Direct sampling method for anomaly imaging from S-parameter
Numerical Analysis
2018-03-13 v1
Abstract
In this paper, we develop a fast imaging technique for small anomalies located in homogeneous media from S-parameter data measured at dipole antennas. Based on the representation of S-parameters when an anomaly exists, we design a direct sampling method (DSM) for imaging an anomaly and establishing a relationship between the indicator function of DSM and an infinite series of Bessel functions of integer order. Simulation results using synthetic data at f=1GHz of angular frequency are illustrated to support the identified structure of the indicator function.
Keywords
Cite
@article{arxiv.1801.02511,
title = {Direct sampling method for anomaly imaging from S-parameter},
author = {Won-Kwang Park},
journal= {arXiv preprint arXiv:1801.02511},
year = {2018}
}
Comments
6 pages, 6 figures