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Deviation Tests for a High-dimensional Mean

Methodology 2026-03-20 v2

Abstract

This paper investigates testing for deviation of a high-dimensional mean vector μ\boldsymbol{\mu}. In contrast to the standard one-sample significance test of the form: H0e:μ=μ0H_0^\texttt{e} : \boldsymbol{\mu} = \boldsymbol{\mu}_0 versus H1e:μμ0H_1^\texttt{e} : \boldsymbol{\mu} \neq \boldsymbol{\mu}_0, we focus on testing the deviation H0:μμ02d0H_0 : \|\boldsymbol{\mu} - \boldsymbol{\mu}_0\|_2 \ge d_0 versus H1:μμ02<d0H_1 : \|\boldsymbol{\mu} - \boldsymbol{\mu}_0\|_2 < d_0 for a prespecified length d0>0d_0 > 0. Constructing a valid test statistic for this problem is technically nontrivial. By applying the concept of positive and negative feedback processes from control theory, we propose a test statistic based on a two-armed bandit (TAB) process. The deviation test is also extended to the two-sample setting. Simulation experiments confirm a good performance of the tests in finite samples. Finally, a real data analysis demonstrates the practical significance of the proposed deviation tests.

Keywords

Cite

@article{arxiv.2603.14431,
  title  = {Deviation Tests for a High-dimensional Mean},
  author = {Zengjing Chen and Ruihan Liu and Jianfeng Yao},
  journal= {arXiv preprint arXiv:2603.14431},
  year   = {2026}
}
R2 v1 2026-07-01T11:20:47.453Z