Development and validation of a cryogenic far-infrared diffraction grating spectrometer used to post-disperse the output from a Fourier transform spectrometer
Abstract
Recent advances in far-infrared detector technology have led to increases in raw sensitivity of more than an order of magnitude over previous state-of-the-art detectors. With such sensitivity, photon noise becomes the dominant noise component, even when using cryogenically cooled optics, unless a method of restricting the spectral bandpass is employed. The leading instrument concept features reflecting diffraction gratings which post-disperse the light that has been modulated by a polarizing Fourier transform spectrometer (FTS) onto a detector array, thereby reducing the photon noise on each detector. This paper discusses the development of a cryogenic (4 K) diffraction grating spectrometer which operates over the wavelength range from 285 - 500 m and was used to post-disperse the output from a room-temperature polarizing FTS. Measurements of the grating spectral response and diffraction efficiency are presented as a function of both wavelength and polarization to characterize the instrumental performance.
Keywords
Cite
@article{arxiv.2401.04488,
title = {Development and validation of a cryogenic far-infrared diffraction grating spectrometer used to post-disperse the output from a Fourier transform spectrometer},
author = {Alicia M. Anderson and David A. Naylor and Brad G. Gom and Matthew A. Buchan and Adam J. Christiansen and Ian T. Veenendaal},
journal= {arXiv preprint arXiv:2401.04488},
year = {2024}
}
Comments
9 pages, 14 figures. The following article has been accepted by Review of Scientific Instruments. It can be found at https://doi.org/10.1063/5.0177603