Determination of topological properties of thin samples by the van der Pauw method
Abstract
We solve the problem of determining basic topological properties of flat samples by performing measurements on their outer edge. The global maximum of four probe resistances shows a characteristic behaviour, which is dependent on the genus (i.e., the number of holes) of the domain. An extension of the van der Pauw method on domains having zero, one, or two holes is presented and discussed. A possibility of measuring topological properties of condensed matter is demonstrated. Experimental results for triply connected domains are presented and explained by continuous symmetry breaking caused by the presence of two holes. The results are consistent with the topological theorem of Hurwitz on the number of automorphisms of Riemann surfaces.
Keywords
Cite
@article{arxiv.1905.09775,
title = {Determination of topological properties of thin samples by the van der Pauw method},
author = {Krzysztof R. Szymański and Cezary J. Walczyk and Jan L. Cieśliński},
journal= {arXiv preprint arXiv:1905.09775},
year = {2019}
}
Comments
11 pages, 2 figures