Lack of directional bonding between two-dimensional crystals like graphene or monolayer transition metal dichalcogenides provides unusual freedom in selection of components for vertical van der Waals heterostructures. However, even for identical layers, their stacking, in particular the relative angle between their crystallographic directions, modifies properties of the structure. We demonstrate that the interatomic coupling between two two-dimensional crystals can be determined from angle-resolved photoemission spectra of a trilayer structure with one aligned and one twisted interface. Each of the interfaces provides complementary information and together they enable self-consistent determination of the coupling. We parametrize interatomic coupling for carbon atoms by studying twisted trilayer graphene and show that the result can be applied to structures with different twists and number of layers. Our approach demonstrates how to extract fundamental information about interlayer coupling in a stack of two-dimensional crystals and can be applied to many other van der Waals interfaces.
@article{arxiv.2007.08946,
title = {Determination of interatomic coupling between two-dimensional crystals using angle-resolved photoemission spectroscopy},
author = {J. J. P. Thompson and D. Pei and H. Peng and H. Wang and N. Channa and H. L. Peng and A. Barinov and N. B. M. Schröter and Y. Chen and M. Mucha-Kruczyński},
journal= {arXiv preprint arXiv:2007.08946},
year = {2020}
}
Comments
This is a post-peer-review, pre-copyedit version of an article published in Nature Communications. The final authenticated version is available online at: http://dx.doi.org/10.1038/s41467-020-17412-0