Depth-dependent critical behavior in V2H
Materials Science
2013-05-29 v3 Statistical Mechanics
Abstract
Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
Cite
@article{arxiv.0902.2414,
title = {Depth-dependent critical behavior in V2H},
author = {Charo I. Del Genio and Johann Trenkler and Kevin E. Bassler and Peter Wochner and Dean R. Haeffner and George F. Reiter and Jianming Bai and Simon C. Moss},
journal= {arXiv preprint arXiv:0902.2414},
year = {2013}
}
Comments
5 pages, 4 figures