Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Point
Soft Condensed Matter
2014-04-30 v2
Abstract
We examine the applicability of various model profiles for the liquid/vapor interface by X-ray reflectivities on water and ethanol and their mixtures at room temperature. Analysis of the X-ray reflecivities using various density profiles shows an error-function like profile is the most adequate within experimental error. Our finding, together with recent observations from simulation studies on liquid surfaces, strongly suggest that the capillary-wave dynamics shapes the interfacial density profile in terms of the error function.
Keywords
Cite
@article{arxiv.1403.1469,
title = {Density Profiles of Liquid/Vapor Interfaces Away from Their Critical Point},
author = {Wei Bu and Doseok Kim and David Vaknin},
journal= {arXiv preprint arXiv:1403.1469},
year = {2014}
}