Defect Antichains and Multigraded Symbolic Defect Series of Edge Ideals under Graph Blow-ups
Abstract
In this paper, we study symbolic defect functions of edge ideals through finite antichains of exponent vectors. Let be a finite simple graph and let be its edge ideal. For each symbolic degree , we define the symbolic exponent region , the ordinary exponent region , and the symbolic defect antichain , where the minimum is taken with respect to the componentwise partial order. We prove that gives a finite obstruction set controlling the minimal monomial generators of the quotient . Our main result is a blow-up transfer formula. If is the graph obtained from by replacing each vertex by an independent set of size , then for every , We further refine this formula to a multigraded symbolic defect series, which records the full multidegree distribution of the minimal generators of . As applications, we classify the defect antichains of complete graphs in terms of integer partitions and derive explicit symbolic defect formulas for complete multipartite graphs, complete split graphs, and blow-ups of odd cycles. We also study symbolic defect antichains under graph joins and obtain polynomiality and rational generating-function consequences in the blow-up parameters. The results provide a unified antichain-based framework for symbolic defects of edge ideals and convert several previously case-by-case computations into consequences of a single transfer principle.
Cite
@article{arxiv.2606.29817,
title = {Defect Antichains and Multigraded Symbolic Defect Series of Edge Ideals under Graph Blow-ups},
author = {Tabinda Rasheed and Wang Yao},
journal= {arXiv preprint arXiv:2606.29817},
year = {2026}
}
Comments
26 pages