English

Decay scheme of 50V

Nuclear Experiment 2020-08-07 v1

Abstract

Investigation of the 50^{50}V electron-capture to the 2+2^+ 1553.8 keV level of 50^{50}Ti and search for β\beta^- decay of 50^{50}V to the 2+2^+ 783.3 keV level of 50^{50}Cr (both those decays are fourfold forbidden with ΔJΔπ=4+\Delta J^{\Delta \pi}=4^+) have been performed using a vanadium sample of natural isotopic abundance with mass of 955 g. The measurements were conducted with the help of an ultra low-background HPGe-detector system located 225 m underground in the laboratory HADES (Belgium). The measured value of the half-life of 50^{50}V for electron capture was T1/2EC=(2.770.19+0.20)×1017T^{\mathrm{EC}}_{1/2}=(2.77^{+0.20}_{-0.19})\times 10^{17} yr. The β\beta^--decay branch was not detected and the corresponding lower bound of the half-life was T1/2β8.9×1018T^{\beta}_{1/2}\geq 8.9\times 10^{18} yr at the 90\% confidence level.

Keywords

Cite

@article{arxiv.2008.02751,
  title  = {Decay scheme of 50V},
  author = {F. A. Danevich and M. Hult and D. V. Kasperovych and V. R. Klavdiienko and G. Lutter and G. Marissens and O. G. Polischuk and V. I. Tretyak},
  journal= {arXiv preprint arXiv:2008.02751},
  year   = {2020}
}

Comments

20 pages, 9 figures, 7 tables, 27 references

R2 v1 2026-06-23T17:41:12.620Z