Data metrology -- the assessment of the quality of data -- particularly in scientific and industrial settings, has emerged as an important requirement for the UK National Physical Laboratory (NPL) and other national metrology institutes. Data provenance and data curation are key components for emerging understanding of data metrology. However, to date provenance research has had limited visibility to or uptake in metrology. In this work, we summarize a scoping study carried out with NPL staff and industrial participants to understand their current and future needs for provenance, curation and data quality. We then survey provenance technology and standards that are relevant to metrology. We analyse the gaps between requirements and the current state of the art.
@article{arxiv.2102.08228,
title = {Data provenance, curation and quality in metrology},
author = {James Cheney and Adriane Chapman and Joy Davidson and Alistair Forbes},
journal= {arXiv preprint arXiv:2102.08228},
year = {2023}
}