This paper proposes the preliminary study of the data-driven failure analysis model for the internet of things (IoT) devices. This model focus on the impact of data transferring both get and receiving data in class C of Low Power Wide Area Network (LoRaWAN). To set up the network, the authors develop the combination of four several technology parts, including 1) the End Device Gateway Network server of LoRa IoT, 2) an Application server for storing the data in the database, 3) the Dashboard to show and got the command by the user, and 4) the failure analysis model based on Bayesian belief networks which calculate the probability values that collect the data transferring both uplink and downlink on the network connection in this study. In the testing phase, the authors input the separated data into the data-driven failure analysis model to analyze the time and latency of the connection by the concern of the impact and risk of the failure of the overall system. The model will show the probability value of failure. The authors hope to use the results to clarify whether a tested IoT device is suitable for use or not.
@article{arxiv.2207.00173,
title = {Data-Driven Model for Failure Analysis of Internet of Things Devices: A Preliminary Study},
author = {Thanitnan Kammuang and Watthanai Luealamai and Issarapong Khuankrue},
journal= {arXiv preprint arXiv:2207.00173},
year = {2022}
}
Comments
4 pages, submitted to 2021 Second International Symposium on Instrumentation, Control, Artificial Intelligence, and Robotics (ICA-SYMP) - Area 8: Cyber-Physical Systems and IoT (Position Paper)