English

darfix: Data analysis for dark-field X-ray microscopy

Materials Science 2022-05-12 v1

Abstract

A Python package for the analysis of dark-field X-ray microscopy (DFXM) and rocking curve imaging (RCI) data is presented. \textit{darfix} provides a set of data processing and visualization tools that can be either imported as library components or accessed through a graphical user interface (GUI) as an Orange add-on. In the latter case, the different analysis modules can be easily chained to define computational workflows. Operations on larger-than-memory image sets are supported through the implementation of online versions of the data processing algorithms, effectively trading performance for feasibility when the computing resources are limited. The software can automatically extract the relevant instrument angle settings from the input files metadata. The currently available input file format is EDF and in future releases HDF5 will be incorporated.

Keywords

Cite

@article{arxiv.2205.05494,
  title  = {darfix: Data analysis for dark-field X-ray microscopy},
  author = {Júlia Garriga Ferrer and Raquel Rodríguez-Lamas and Henri Payno and Wout De Nolf and Phil Cook and Vicente Armando Solé Jover and Vincent Favre-Nicolin and Can Yıldırım and Carsten Detlefs},
  journal= {arXiv preprint arXiv:2205.05494},
  year   = {2022}
}

Comments

A data analysis package intended for x-ray imaging. The manuscript is to be submitted to Journal of Synchrotron Radiation

R2 v1 2026-06-24T11:14:17.091Z