D retention and material defects probed using Raman microscopy in JET limiter samples and beryllium-based synthesized samples
Abstract
We report on the detection by means of Raman spectroscopy of amorphous beryllium deuteride, BeD 2 , in magnetron sputtered deposits synthesized in two different laboratories and containing about 20 at.% of deuterium. In contrast, this signature has not been found for the JET limiter samples studied coming from the inner, outer or upper limiters, even when coming from a deposition zone of the limiters. We give a way to disentangle that BeD 2 signature from other signatures falling in the same spectroscopic range and mainly related to other phenomena. We also analyze the Raman characteristics of the JET sample defects. These results could help in the interpretation of D thermal desorption spectra and in future analyses of JET thick Be deposit divertor tiles.
Cite
@article{arxiv.2109.15077,
title = {D retention and material defects probed using Raman microscopy in JET limiter samples and beryllium-based synthesized samples},
author = {C Pardanaud and M Kumar and P Roubin and C Martin and Y Ferro and J Denis and A Widdowson and D Douai and M Baldwin and A Založnik and C Lungu and C Porosnicu and P Dinca and T Dittmar and A Hakola},
journal= {arXiv preprint arXiv:2109.15077},
year = {2021}
}