English

Cut and Learn for Unsupervised Object Detection and Instance Segmentation

Computer Vision and Pattern Recognition 2023-01-27 v1 Artificial Intelligence Machine Learning

Abstract

We propose Cut-and-LEaRn (CutLER), a simple approach for training unsupervised object detection and segmentation models. We leverage the property of self-supervised models to 'discover' objects without supervision and amplify it to train a state-of-the-art localization model without any human labels. CutLER first uses our proposed MaskCut approach to generate coarse masks for multiple objects in an image and then learns a detector on these masks using our robust loss function. We further improve the performance by self-training the model on its predictions. Compared to prior work, CutLER is simpler, compatible with different detection architectures, and detects multiple objects. CutLER is also a zero-shot unsupervised detector and improves detection performance AP50 by over 2.7 times on 11 benchmarks across domains like video frames, paintings, sketches, etc. With finetuning, CutLER serves as a low-shot detector surpassing MoCo-v2 by 7.3% APbox and 6.6% APmask on COCO when training with 5% labels.

Keywords

Cite

@article{arxiv.2301.11320,
  title  = {Cut and Learn for Unsupervised Object Detection and Instance Segmentation},
  author = {Xudong Wang and Rohit Girdhar and Stella X. Yu and Ishan Misra},
  journal= {arXiv preprint arXiv:2301.11320},
  year   = {2023}
}

Comments

Tech report. Project page: http://people.eecs.berkeley.edu/~xdwang/projects/CutLER/. Code is available at https://github.com/facebookresearch/CutLER

R2 v1 2026-06-28T08:22:09.642Z