English

Correspondence between noisy sample space reducing process and records in correlated random events

Statistical Mechanics 2017-09-27 v2

Abstract

We study survival time statistics in a noisy sample space reducing (SSR) process. Our simulations suggest that both the mean and standard deviation scale as N/Nλ\sim N/N^{\lambda}, where NN is the system size and λ\lambda is a tunable parameter that characterizes the process. The survival time distribution has the form PN(τ)NθJ(τ/Nθ)\mathcal{P}_{N}(\tau)\sim N^{-\theta}J(\tau/N^{\theta}), where JJ is a universal scaling function and θ=1λ\theta = 1-\lambda. Analytical insight is provided by a conjecture for the equivalence between the survival time statistics in the noisy SSR process and the record statistics in a correlated time series modeled as drifted random walk with Cauchy distributed jumps.

Keywords

Cite

@article{arxiv.1609.05727,
  title  = {Correspondence between noisy sample space reducing process and records in correlated random events},
  author = {Avinash Chand Yadav},
  journal= {arXiv preprint arXiv:1609.05727},
  year   = {2017}
}

Comments

5 pages, 6 figures

R2 v1 2026-06-22T15:54:09.752Z