Correspondence between noisy sample space reducing process and records in correlated random events
Statistical Mechanics
2017-09-27 v2
Abstract
We study survival time statistics in a noisy sample space reducing (SSR) process. Our simulations suggest that both the mean and standard deviation scale as , where is the system size and is a tunable parameter that characterizes the process. The survival time distribution has the form , where is a universal scaling function and . Analytical insight is provided by a conjecture for the equivalence between the survival time statistics in the noisy SSR process and the record statistics in a correlated time series modeled as drifted random walk with Cauchy distributed jumps.
Cite
@article{arxiv.1609.05727,
title = {Correspondence between noisy sample space reducing process and records in correlated random events},
author = {Avinash Chand Yadav},
journal= {arXiv preprint arXiv:1609.05727},
year = {2017}
}
Comments
5 pages, 6 figures