Consistent Classification with Generalized Metrics
Abstract
We propose a framework for constructing and analyzing multiclass and multioutput classification metrics, i.e., involving multiple, possibly correlated multiclass labels. Our analysis reveals novel insights on the geometry of feasible confusion tensors -- including necessary and sufficient conditions for the equivalence between optimizing an arbitrary non-decomposable metric and learning a weighted classifier. Further, we analyze averaging methodologies commonly used to compute multioutput metrics and characterize the corresponding Bayes optimal classifiers. We show that the plug-in estimator based on this characterization is consistent and is easily implemented as a post-processing rule. Empirical results on synthetic and benchmark datasets support the theoretical findings.
Cite
@article{arxiv.1908.09057,
title = {Consistent Classification with Generalized Metrics},
author = {Xiaoyan Wang and Ran Li and Bowei Yan and Oluwasanmi Koyejo},
journal= {arXiv preprint arXiv:1908.09057},
year = {2019}
}