The insurgence of compression induces wrinkling in actuation devices based on EAPs thin films leading to a sudden decrease of performances up to failure. Based on the classical tension field theory for thin elastic membranes, we provide a general framework for the analysis of the insurgence of in-plane compression in membranes of electroactive polymers (EAPs). Our main result is the deduction of a (voltage-dependent) domain in the stretch space which represents tensile configurations. Under the assumption of Mooney-Rivlin materials, we obtain that for growing values of the applied voltage the domain contracts, vanishing at a critical voltage above which the polymer is wrinkled for any stretch configuration. Our approach can be easily implemented in numerical simulations for more complex material behaviors and provides a tool for the analysis of compression instability as a function of the elastic moduli.
@article{arxiv.1012.1462,
title = {Compression-induced failure of electro-active polymeric thin films},
author = {Domenico De Tommasi and Giuseppe Puglisi and Giuseppe Zurlo},
journal= {arXiv preprint arXiv:1012.1462},
year = {2015}
}