Comparison of Impedance Matching Networks for Scanning Microwave Microscopy
Instrumentation and Detectors
2024-09-18 v1
Abstract
In this paper, a definition of the gain and added noise of impedance matching networks for scanning microwave microscopy is given. This definition can be used to compare different impedance matching techniques independently of the instrument used to measure the S-parameter. As a demonstration, impedance matching devices consisting of a Beatty line, a tuner, and interferometric setups with and without amplifiers have been investigated. Measurement frequencies up to 28 GHz are used, and the maximal resulting gain found was 9504.7 per Siemens.
Keywords
Cite
@article{arxiv.2409.11207,
title = {Comparison of Impedance Matching Networks for Scanning Microwave Microscopy},
author = {Johannes Hoffmann and Sophie de Preville and Bruno Eckmann and Hung-Ju Lin and Benedikt Herzog and Kamel Haddadi and Didier Theron and Georg Gramse and Damien Richert and Jose Moran-Meza and Francois Piquemal},
journal= {arXiv preprint arXiv:2409.11207},
year = {2024}
}
Comments
IEEE Transactions on Instrumentation and Measurement (2024)