Comment on ``Method to analyze electromechanical stability of dielectric elastomers" [Appl. Phys. Lett. 91, 061921 (2007)]
Materials Science
2008-01-15 v3
Abstract
The model of Zhao and Suo can be readily generalized to predict the critical breakdown electric field value of elastomers with arbitrary elastic strain energy function. An explicit expression for is presented for elastomeric thin films under biaxial strain and comparisons are made with experimental data using a two term Ogden rubber elasticity model. Simplified results for uniaxial and for equi-biaxial stress provide further insight into the findings of Zhao and Suo.
Keywords
Cite
@article{arxiv.0709.2497,
title = {Comment on ``Method to analyze electromechanical stability of dielectric elastomers" [Appl. Phys. Lett. 91, 061921 (2007)]},
author = {Andrew N. Norris},
journal= {arXiv preprint arXiv:0709.2497},
year = {2008}
}
Comments
2 pages