Chemical bonding in americium oxides: x-ray spectroscopic view
Abstract
The electronic structure and the chemical state in Am binary oxides and Am-doped UO were studied by means of x-ray absorption spectroscopy at shallow Am core ( and ) edges. In particular, the Am states were probed and the nature of their bonding to the oxygen states was analyzed. The interpretation of the experimental data was supported by the Anderson impurity model (AIM) calculations which took into account the full multiplet structure due to the interaction between electrons as well as the interaction with the core hole. The sensitivity of the branching ratio of the Am and x-ray absorption lines to the chemical state of Am was shown using Am binary oxides as reference systems. The observed ratio for Am-doped UO suggests that at least at low Am concentrations, americium is in the Am(III) state in the UO lattice. To confirm the validity of the applied AIM approach, the analysis of the Am x-ray photoelectron spectra of AmO and AmO was also performed which revealed a good agreement between experiment and calculations. As a whole, AmO can be classified as the charge-transfer compound with the occupancy () equal to 5.73 electrons, while AmO is rather a Mott-Hubbard system with =6.05.
Keywords
Cite
@article{arxiv.2303.09247,
title = {Chemical bonding in americium oxides: x-ray spectroscopic view},
author = {S. M. Butorin and D. K. Shuh},
journal= {arXiv preprint arXiv:2303.09247},
year = {2023}
}