The Gas Electron Multiplier (GEM) detectors are widely used in high-energy physics (HEP) experiments as tracking devices because of their excellent position resolution and to handle high particle rates capability. Charging-up effect is a well known phenomenon in GEM detectors because of the presence of the dielectric medium -- Kapton in the foil. Charging-up of GEM foil takes place when it is exposed to high radiation after application of high voltage. A new phenomenon of reverse charging-up, a complementary behaviour is also observed when the irradiation rate is reduced, where the gain relaxes gradually towards its initial value. In this study, the charging-up and reverse charging-up effects are investigated for a double-mask triple GEM chamber operated with an Argon and Carbon dioxide (70/30) gas mixture. The measurements provide a detailed understanding of the gain variation under irradiation and its stabilisation behaviour. The experimental setup, methodology and results are presented in this article.
@article{arxiv.2605.02922,
title = {Charging-up and reverse charging-up phenomena in a double-mask triple GEM detector},
author = {S. Mandal and S. Ghosh and S. Das and S. Biswas},
journal= {arXiv preprint arXiv:2605.02922},
year = {2026}
}