Characterize localization length of disordered lattices via critical coupling effect
Abstract
Light localization by scattering is a fundamental mechanism driving phase transitions of wave transport in disordered systems. Characterizing the localization length in scattering systems is crucial yet challenging. In this Letter, we demonstrate a spatially matched coupling scheme using wavefront shaping to resolve the intrinsic localization length in two-dimensional disordered lattices. By tailoring the incident wavefront, our method facilitates efficient coupling of light to the minimum localized mode. We apply this approach to measure two different self-assembled lattices, and report the first observation of the critical coupling effect, which allows for the direct determination of the characteristic size of minimum localized mode. Our results reveal that for a fixed lattice periodicity, increasing the air-hole diameter significantly reduces this intrinsic localization length. This far-field metrology offers a robust framework for probing wave localization in complex media, which should be useful in various applications such as random lasing and nonlinear optics
Cite
@article{arxiv.2604.03771,
title = {Characterize localization length of disordered lattices via critical coupling effect},
author = {Fuhao Ji and Xiangqi Huang and Luxing Chen and Yuxiang Tian and Wenjing Li and Yinying Peng and Yuge Qiu and Lu Zhang and Liwei Zhang and Mingfang Yi and Peilong Hong},
journal= {arXiv preprint arXiv:2604.03771},
year = {2026}
}
Comments
5 pages, 5 figures