Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source

E. M. Boulton; E. Bernard; N. Destefano; B. N. V. Edwards; M. Gai; S. A. Hertel; M. Horn; N. A. Larsen; B. P. Tennyson; C. Wahl; D. N. McKinsey

doi:10.1088/1748-0221/12/08/P08004

Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source

Instrumentation and Detectors 2017-09-13 v3

Authors: E. M. Boulton , E. Bernard , N. Destefano , B. N. V. Edwards , M. Gai , S. A. Hertel , M. Horn , N. A. Larsen , B. P. Tennyson , C. Wahl , D. N. McKinsey

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Abstract

We calibrate a two-phase xenon detector at 0.27 keV in the charge channel and at 2.8 keV in both the light and charge channels using a $^{37}$ Ar source that is directly released into the detector. We map the light and charge yields as a function of electric drift field. For the 2.8 keV peak, we calculate the Thomas-Imel box parameter for recombination and determine its dependence on drift field. For the same peak, we achieve an energy resolution, $E_{\sigma}/E_{mean}$ , between 9.8% and 10.8% for 0.1 kV/cm to 2 kV/cm electric drift fields.

Keywords

two-phase xenon detector time projection chamber calibration Ar-37 source charge yield light yield Thomas-Imel box parameter energy resolution

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@article{arxiv.1705.08958,
  title  = {Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source},
  author = {E. M. Boulton and E. Bernard and N. Destefano and B. N. V. Edwards and M. Gai and S. A. Hertel and M. Horn and N. A. Larsen and B. P. Tennyson and C. Wahl and D. N. McKinsey},
  journal= {arXiv preprint arXiv:1705.08958},
  year   = {2017}
}

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12 pages, 7 figures

Calibration of a two-phase xenon time projection chamber with a $^{37}$Ar source

Abstract

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