Beating Temporal Phase Sensitivity Limit in Off-axis Interferometry based Quantitative Phase Microscopy
Abstract
Phase sensitivity determines the lowest optical path length (OPL) value that can be detected from the noise floor in a quantitative phase microscopy (QPM) system. The temporal phase sensitivity is known to be limited by both photon shot-noise and a variety of noise sources from electronic devices and environment. To beat temporal phase sensitivity limit, we explore different ways to reduce different noise factors in off-axis interferometry-based QPM using laser-illumination. Using a high electron-well-capacity camera, we measured the temporal phase sensitivity values using non-common-path and common-path interferometry based QPM systems under different environmental conditions. A frame summing method and a spatiotemporal filtering method are further used to reduce the noise contributions, thus enabling us to push the overall temporal phase sensitivity to less than 2 picometers.
Cite
@article{arxiv.2010.11477,
title = {Beating Temporal Phase Sensitivity Limit in Off-axis Interferometry based Quantitative Phase Microscopy},
author = {Yujie Nie and Renjie Zhou},
journal= {arXiv preprint arXiv:2010.11477},
year = {2024}
}