Bayesian Few-Shot Classification with One-vs-Each P\'olya-Gamma Augmented Gaussian Processes
Abstract
Few-shot classification (FSC), the task of adapting a classifier to unseen classes given a small labeled dataset, is an important step on the path toward human-like machine learning. Bayesian methods are well-suited to tackling the fundamental issue of overfitting in the few-shot scenario because they allow practitioners to specify prior beliefs and update those beliefs in light of observed data. Contemporary approaches to Bayesian few-shot classification maintain a posterior distribution over model parameters, which is slow and requires storage that scales with model size. Instead, we propose a Gaussian process classifier based on a novel combination of P\'olya-Gamma augmentation and the one-vs-each softmax approximation that allows us to efficiently marginalize over functions rather than model parameters. We demonstrate improved accuracy and uncertainty quantification on both standard few-shot classification benchmarks and few-shot domain transfer tasks.
Cite
@article{arxiv.2007.10417,
title = {Bayesian Few-Shot Classification with One-vs-Each P\'olya-Gamma Augmented Gaussian Processes},
author = {Jake Snell and Richard Zemel},
journal= {arXiv preprint arXiv:2007.10417},
year = {2021}
}
Comments
Extended version of accepted ICLR 2021 submission. 34 pages, 9 figures