English

BAFLineDP: Code Bilinear Attention Fusion Framework for Line-Level Defect Prediction

Software Engineering 2024-02-13 v1

Abstract

Software defect prediction aims to identify defect-prone code, aiding developers in optimizing testing resource allocation. Most defect prediction approaches primarily focus on coarse-grained, file-level defect prediction, which fails to provide developers with the precision required to locate defective code. Recently, some researchers have proposed fine-grained, line-level defect prediction methods. However, most of these approaches lack an in-depth consideration of the contextual semantics of code lines and neglect the local interaction information among code lines. To address the above issues, this paper presents a line-level defect prediction method grounded in a code bilinear attention fusion framework (BAFLineDP). This method discerns defective code files and lines by integrating source code line semantics, line-level context, and local interaction information between code lines and line-level context. Through an extensive analysis involving within- and cross-project defect prediction across 9 distinct projects encompassing 32 releases, our results demonstrate that BAFLineDP outperforms current advanced file-level and line-level defect prediction approaches.

Keywords

Cite

@article{arxiv.2402.07132,
  title  = {BAFLineDP: Code Bilinear Attention Fusion Framework for Line-Level Defect Prediction},
  author = {Shaojian Qiu and Huihao Huang and Jianxiang Luo and Yingjie Kuang and Haoyu Luo},
  journal= {arXiv preprint arXiv:2402.07132},
  year   = {2024}
}

Comments

Accepted by IEEE SANER 2024

R2 v1 2026-06-28T14:45:14.163Z