English

Average and reliability error exponents in low-density parity-check codes

Disordered Systems and Neural Networks 2016-08-31 v1

Abstract

We present a theoretical method for a direct evaluation of the average and reliability error exponents in low-density parity-check error-correcting codes using methods of statistical physics. Results for the binary symmetric channel (BSC) are presented for codes of both finite and infinite connectivity.

Keywords

Cite

@article{arxiv.cond-mat/0304520,
  title  = {Average and reliability error exponents in low-density parity-check codes},
  author = {N. S. Skantzos and J. van Mourik and D. Saad and Y. Kabashima},
  journal= {arXiv preprint arXiv:cond-mat/0304520},
  year   = {2016}
}

Comments

13 pages, 5 figures